#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900201590
Mfr serial number	STN10952-01590

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	13/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900201590

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10245
I_LEAK350V (microA)	0.15202
Substr Origin	065
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	65
R Bias Upper (MOhm)	1.47
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	
Poly-Si break ch. 184	


#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	364																																							
Pinhole	367																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA	
#IV	
10	35.46
20	48.34
30	55.22
40	60.41
50	64.76
60	68.83
70	72.96
80	77.18
90	81.27
100	85.21
110	88.97
120	92.64
130	96.03
140	99.26
150	102.45
160	105.45
170	108.35
180	111.25
190	113.98
200	116.66
210	119.36
220	121.91
230	124.43
240	126.89
250	129.38
260	131.78
270	134.11
280	136.49
290	138.76
300	141.01
310	143.3
320	145.5
330	147.66
340	149.87
350	152.02
	
#CV	
10	
15	O.L.
20	O.L.
25	2707.86
30	2332.8
35	2073.27
40	1881.77
45	1733.2
50	1617.92
55	1532.82
60	1478.23
65	1447.97
70	1433.4
75	1426.7
80	1423.26
85	1421.12
90	1419.51
95	1418.2
100	1417.07
105	1416.02
110	1415.01
115	1414.27
120	1413.47

#End of manufacturer data file