#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900201745
Mfr serial number	STN11020-01745

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900201745

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.08513
I_LEAK350V (microA)	0.1264
Substr Origin	068
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	55
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	9.871
20	40.49
30	45.63
40	49.46
50	52.92
60	56.48
70	60.09
80	63.78
90	67.42
100	70.82
110	73.97
120	76.99
130	79.78
140	82.47
150	85.13
160	87.62
170	90.07
180	92.41
190	94.78
200	97.02
210	99.22
220	101.43
230	103.5
240	105.58
250	107.64
260	109.64
270	111.61
280	113.58
290	115.46
300	117.32
310	119.15
320	121.03
330	122.82
340	124.6
350	126.4
	
#CV	
10	
15	O.L.
20	2752.93
25	2265.06
30	1955.61
35	1740.07
40	1588.42
45	1495.45
50	1452.11
55	1435.47
60	1428.59
65	1424.88
70	1422.32
75	1420.26
80	1418.64
85	1417.28
90	1416.01
95	1414.91
100	1413.97
105	1413.13
110	1412.35
115	1411.58
120	1410.88

#End of manufacturer data file