#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900201747
Mfr serial number	STN11020-01747

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900201747

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.08576
I_LEAK350V (microA)	0.15151
Substr Origin	068
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	50
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	9.397
20	40.6
30	45.72
40	49.58
50	53.07
60	56.66
70	60.27
80	63.98
90	67.67
100	71.09
110	74.29
120	77.36
130	80.22
140	83
150	85.76
160	88.41
170	91.01
180	93.55
190	96.11
200	98.6
210	101.07
220	103.59
230	106.07
240	108.59
250	111.22
260	113.91
270	116.77
280	119.79
290	122.9
300	126.22
310	129.75
320	134.2
330	138.61
340	144.15
350	151.51
	
#CV	
10	
15	O.L.
20	2731.18
25	2248.89
30	1942.59
35	1729.91
40	1581.77
45	1492.82
50	1453.11
55	1438.33
60	1432.1
65	1428.49
70	1426.05
75	1424.14
80	1422.46
85	1421.07
90	1419.95
95	1418.88
100	1417.87
105	1416.94
110	1416.28
115	1415.61
120	1414.85

#End of manufacturer data file