#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900201750
Mfr serial number	STN11020-01750

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900201750

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.08662
I_LEAK350V (microA)	0.12846
Substr Origin	068
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	50
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	9.815
20	41.41
30	46.7
40	50.66
50	54.24
60	57.88
70	61.52
80	65.2
90	68.82
100	72.23
110	75.39
120	78.43
130	81.24
140	83.94
150	86.62
160	89.15
170	91.61
180	93.98
190	96.38
200	98.65
210	100.87
220	103.1
230	105.22
240	107.3
250	109.41
260	111.41
270	113.42
280	115.43
290	117.34
300	119.25
310	121.11
320	122.99
330	124.83
340	126.64
350	128.46
	
#CV	
10	
15	O.L.
20	2726.81
25	2244.8
30	1938.69
35	1726.43
40	1578.33
45	1489.67
50	1450.11
55	1435.2
60	1428.81
65	1425.18
70	1422.75
75	1420.79
80	1419.18
85	1417.79
90	1416.59
95	1415.63
100	1414.65
105	1413.7
110	1413.07
115	1412.31
120	1411.56

#End of manufacturer data file