#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900201754
Mfr serial number	STN11020-01754

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900201754

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.08751
I_LEAK350V (microA)	0.12852
Substr Origin	064
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	70
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	31.43
20	42.15
30	47.97
40	52.37
50	56.31
60	60.09
70	63.77
80	67.32
90	70.69
100	73.83
110	76.8
120	79.66
130	82.29
140	84.94
150	87.51
160	89.94
170	92.3
180	94.62
190	96.92
200	99.12
210	101.31
220	103.46
230	105.53
240	107.59
250	109.68
260	111.64
270	113.64
280	115.6
290	117.52
300	119.42
310	121.25
320	123.13
330	125.01
340	126.76
350	128.52
	
#CV	
10	
15	O.L.
20	O.L.
25	2793.8
30	2407
35	2135.97
40	1935.34
45	1779.89
50	1658.02
55	1563.54
60	1498.53
65	1459.86
70	1440.4
75	1431.44
80	1427.12
85	1424.58
90	1422.82
95	1421.4
100	1420.24
105	1419.25
110	1418.47
115	1417.9
120	1417.06

#End of manufacturer data file