#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900201755
Mfr serial number	STN11020-01755

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900201755

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.07996
I_LEAK350V (microA)	0.11633
Substr Origin	064
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	70
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	551																																							
Pinhole	552																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA	
#IV	
10	0.06267
20	81.2
30	0.3226
40	47.75
50	51.35
60	54.87
70	58.22
80	61.5
90	64.58
100	67.48
110	70.2
120	72.8
130	75.26
140	77.61
150	79.96
160	82.16
170	84.3
180	86.37
190	88.46
200	90.44
210	92.38
220	94.32
230	96.18
240	98.01
250	99.85
260	101.61
270	103.35
280	105.07
290	106.79
300	108.43
310	110.06
320	111.71
330	113.26
340	114.78
350	116.33
	
#CV	
10	
15	O.L.
20	O.L.
25	2781.07
30	2396.58
35	2127.41
40	1927.94
45	1773.41
50	1651.99
55	1557.78
60	1492.62
65	1453.35
70	1433.23
75	1424.09
80	1419.62
85	1417.09
90	1415.29
95	1414.02
100	1412.8
105	1411.83
110	1411.14
115	1410.39
120	1409.69

#End of manufacturer data file