#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900201756
Mfr serial number	STN11020-01756

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900201756

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.07949
I_LEAK350V (microA)	0.11459
Substr Origin	064
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	28.61
20	38.43
30	43.74
40	47.87
50	51.51
60	54.96
70	58.18
80	61.37
90	64.44
100	67.29
110	69.98
120	72.53
130	74.93
140	77.23
150	79.49
160	81.63
170	83.7
180	85.72
190	87.72
200	89.64
210	91.51
220	93.37
230	95.18
240	96.93
250	98.72
260	100.42
270	102.1
280	103.78
290	105.37
300	107.01
310	108.57
320	110.16
330	111.67
340	113.14
350	114.59
	
#CV	
10	
15	O.L.
20	O.L.
25	2920.44
30	2516.35
35	2233.95
40	2023
45	1859.57
50	1729.93
55	1624.46
60	1543.07
65	1486.77
70	1453.57
75	1436.95
80	1429.15
85	1425.26
90	1422.91
95	1421.27
100	1420.05
105	1419.02
110	1418.14
115	1417.33
120	1416.55

#End of manufacturer data file