#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900201757
Mfr serial number	STN11020-01757

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900201757

#Test data Data section	
%DATA	
TEMPERATURE (C)	24
I_LEAK150V (microA)	0.08317
I_LEAK350V (microA)	0.12051
Substr Origin	064
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	29.7
20	39.81
30	45.4
40	49.79
50	53.66
60	57.2
70	60.6
80	64
90	67.24
100	70.28
110	73.1
120	75.82
130	78.35
140	80.77
150	83.17
160	85.45
170	87.65
180	89.78
190	91.92
200	93.95
210	95.94
220	97.92
230	99.82
240	101.72
250	103.6
260	105.4
270	107.17
280	108.97
290	110.7
300	112.39
310	114.07
320	115.76
330	117.38
340	118.96
350	120.51
	
#CV	
10	
15	O.L.
20	O.L.
25	2925.25
30	2520.26
35	2237.85
40	2026.61
45	1863.45
50	1734.05
55	1628.5
60	1546.44
65	1488.64
70	1453.91
75	1436.17
80	1427.59
85	1423.47
90	1421.05
95	1419.37
100	1418.04
105	1416.95
110	1416.07
115	1415.2
120	1414.48

#End of manufacturer data file