#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900201760
Mfr serial number	STN11020-01760

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900201760

#Test data Data section	
%DATA	
TEMPERATURE (C)	23
I_LEAK150V (microA)	0.08217
I_LEAK350V (microA)	0.12042
Substr Origin	064
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	28.71
20	38.78
30	44.23
40	48.37
50	51.91
60	55.47
70	59.15
80	62.7
90	66.02
100	69.09
110	71.95
120	74.7
130	77.28
140	79.75
150	82.17
160	84.53
170	86.75
180	88.94
190	91.11
200	93.18
210	95.24
220	97.26
230	99.21
240	101.14
250	103.07
260	104.91
270	106.72
280	108.59
290	110.36
300	112.08
310	113.8
320	115.51
330	117.14
340	118.77
350	120.42
	
#CV	
10	
15	O.L.
20	O.L.
25	2717.48
30	2343.24
35	2080.96
40	1886.85
45	1736.64
50	1619.83
55	1532.59
60	1476.9
65	1446.34
70	1432.03
75	1425.58
80	1422.22
85	1420.05
90	1418.51
95	1417.19
100	1416.05
105	1415.06
110	1414.2
115	1413.49
120	1412.84

#End of manufacturer data file