#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900201762
Mfr serial number	STN11020-01762

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900201762

#Test data Data section	
%DATA	
TEMPERATURE (C)	23
I_LEAK150V (microA)	0.07823
I_LEAK350V (microA)	0.11384
Substr Origin	064
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	27.67
20	37.08
30	42.28
40	46.36
50	49.89
60	53.34
70	56.69
80	59.91
90	63
100	65.88
110	68.57
120	71.18
130	73.62
140	75.93
150	78.23
160	80.41
170	82.51
180	84.55
190	86.61
200	88.54
210	90.45
220	92.36
230	94.19
240	95.98
250	97.79
260	99.54
270	101.23
280	102.95
290	104.58
300	106.2
310	107.77
320	109.35
330	110.86
340	112.35
350	113.84
	
#CV	
10	
15	O.L.
20	O.L.
25	2910.47
30	2510.23
35	2231.07
40	2021.86
45	1860.53
50	1732.22
55	1627.11
60	1544.83
65	1487
70	1452.66
75	1435.21
80	1426.71
85	1422.61
90	1420.16
95	1418.46
100	1417.17
105	1416.08
110	1415.26
115	1414.41
120	1413.67

#End of manufacturer data file