#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900201766
Mfr serial number	STN11020-01766

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900201766

#Test data Data section	
%DATA	
TEMPERATURE (C)	23
I_LEAK150V (microA)	0.08483
I_LEAK350V (microA)	0.12337
Substr Origin	064
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	30.15
20	40.69
30	46.42
40	50.91
50	54.83
60	58.52
70	62.05
80	65.44
90	68.72
100	71.74
110	74.61
120	77.35
130	79.91
140	82.39
150	84.83
160	87.16
170	89.38
180	91.59
190	93.78
200	95.82
210	97.91
220	99.95
230	101.91
240	103.84
250	105.79
260	107.66
270	109.53
280	111.38
290	113.15
300	114.91
310	116.64
320	118.38
330	120.05
340	121.71
350	123.37
	
#CV	
10	
15	O.L.
20	O.L.
25	2915
30	2511.72
35	2230.53
40	2019.9
45	1857.36
50	1728.1
55	1622.77
60	1541.41
65	1485.24
70	1452.49
75	1435.88
80	1428.11
85	1424.18
90	1421.94
95	1420.35
100	1419.03
105	1417.82
110	1417.11
115	1416.34
120	1415.56

#End of manufacturer data file