#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900201767
Mfr serial number	STN11020-01767

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900201767

#Test data Data section	
%DATA	
TEMPERATURE (C)	23
I_LEAK150V (microA)	0.11236
I_LEAK350V (microA)	0.1955
Substr Origin	064
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	72																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.3
20	47.23
30	57.67
40	73.06
50	86.61
60	90.71
70	93.8
80	98.37
90	101.45
100	102.81
110	100.69
120	102.44
130	105.2
140	108.14
150	112.36
160	117.54
170	121.54
180	124.65
190	129.34
200	133.47
210	138.98
220	144.07
230	147.87
240	151.55
250	155.07
260	160.81
270	164.48
280	166.16
290	173.2
300	175.43
310	180.7
320	184.4
330	187.6
340	190.9
350	195.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2912.78
30	2511.86
35	2231.3
40	2020.52
45	1857.37
50	1727.97
55	1622.17
60	1540.12
65	1483.06
70	1449.48
75	1432.71
80	1424.61
85	1420.7
90	1418.42
95	1416.75
100	1415.5
105	1414.33
110	1413.53
115	1412.67
120	1411.97

#End of manufacturer data file