#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900201770
Mfr serial number	STN11020-01770

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900201770

#Test data Data section	
%DATA	
TEMPERATURE (C)	23
I_LEAK150V (microA)	0.08076
I_LEAK350V (microA)	0.11534
Substr Origin	064
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	29.55
20	39.61
30	45.21
40	49.54
50	53.2
60	56.73
70	59.89
80	63.07
90	66
100	68.85
110	71.43
120	73.96
130	76.28
140	78.54
150	80.76
160	82.84
170	84.9
180	86.85
190	88.84
200	90.7
210	92.57
220	94.38
230	96.19
240	97.87
250	99.63
260	101.32
270	102.97
280	104.66
290	106.24
300	107.83
310	109.38
320	110.91
330	112.47
340	113.87
350	115.34
	
#CV	
10	
15	O.L.
20	O.L.
25	2956.43
30	2548.75
35	2263.5
40	2050.34
45	1885.39
50	1754.15
55	1646.56
60	1561.83
65	1500.19
70	1461.89
75	1441.43
80	1431.28
85	1426.26
90	1423.5
95	1421.65
100	1420.3
105	1419.23
110	1418.22
115	1417.45
120	1416.81

#End of manufacturer data file