#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900201797
Mfr serial number	STN11021-01797

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	28/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900201797

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.09474
I_LEAK350V (microA)	0.14148
Substr Origin	066
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.61
R Bias Lower (MOhm)	1.37

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	269																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	29.97
20	43.42
30	49.59
40	54.21
50	58.61
60	63.13
70	67.58
80	71.63
90	75.48
100	79.09
110	82.47
120	85.76
130	88.81
140	91.83
150	94.74
160	97.59
170	100.29
180	102.93
190	105.6
200	108.2
210	110.73
220	113.19
230	115.64
240	117.96
250	120.39
260	122.62
270	124.9
280	127.16
290	129.27
300	131.41
310	133.51
320	135.52
330	137.55
340	139.46
350	141.48
	
#CV	
10	
15	O.L.
20	O.L.
25	2500.1
30	2158.32
35	1917.77
40	1742.99
45	1611.3
50	1519.57
55	1465.34
60	1438.67
65	1426.93
70	1421.51
75	1418.5
80	1416.53
85	1414.97
90	1413.63
95	1412.55
100	1411.6
105	1410.71
110	1409.9
115	1409.17
120	1408.51

#End of manufacturer data file