#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900201832
Mfr serial number	STN11018-01832

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	28/03/2001
PROBLEM	NO
PASSED	YES
Run number	20220900201832

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.09467
I_LEAK350V (microA)	0.13828
Substr Origin	063
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	50
R Bias Upper (MOhm)	1.44
R Bias Lower (MOhm)	1.26

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	10.842
20	46.92
30	52.47
40	56.45
50	60.33
60	64.26
70	68.17
80	72.18
90	76.06
100	79.64
110	82.93
120	86.04
130	88.97
140	91.9
150	94.67
160	97.34
170	99.89
180	102.46
190	104.93
200	107.35
210	109.73
220	112.02
230	114.19
240	116.46
250	118.62
260	120.78
270	122.86
280	124.89
290	126.9
300	128.89
310	130.81
320	132.69
330	134.53
340	136.46
350	138.28
	
#CV	
10	
15	O.L.
20	2543.54
25	2098.18
30	1815.29
35	1622.79
40	1507.39
45	1455.49
50	1437.81
55	1431.22
60	1427.7
65	1425.27
70	1423.29
75	1421.64
80	1420.18
85	1418.85
90	1417.65
95	1416.58
100	1415.56
105	1414.52
110	1413.64
115	1412.82
120	1412.06

#End of manufacturer data file