#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900202263
Mfr serial number	STN11171-02263

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	25/04/2001
PROBLEM	NO
PASSED	YES
Run number	20220900202263

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.1414
I_LEAK350V (microA)	0.2138
Substr Origin	083
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	70
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	
"Poly-Si break ch. 26, 27"	


#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	43.56
20	61.14
30	70.92
40	79.46
50	86.9
60	93.27
70	99.27
80	105.2
90	110.83
100	116.41
110	121.65
120	126.87
130	131.68
140	136.59
150	141.4
160	146.1
170	150.36
180	155.34
190	159.61
200	163.93
210	168.22
220	172.24
230	175.95
240	179.58
250	183.1
260	186.7
270	190.1
280	193.3
290	196.4
300	199.7
310	202.6
320	205.4
330	208.4
340	211.1
350	213.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2832.05
30	2440.48
35	2167.26
40	1963.22
45	1805.76
50	1680.94
55	1580.81
60	1507.1
65	1458.88
70	1432.06
75	1418.91
80	1412.52
85	1409.2
90	1407.12
95	1405.57
100	1404.25
105	1403.16
110	1402.33
115	1401.57
120	1400.82

#End of manufacturer data file