#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900202264
Mfr serial number	STN11171-02264

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	25/04/2001
PROBLEM	NO
PASSED	YES
Run number	20220900202264

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.13956
I_LEAK350V (microA)	0.2097
Substr Origin	083
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	70
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.9
20	59.97
30	69.36
40	77.89
50	85.09
60	91.3
70	97.24
80	103.1
90	108.63
100	114.34
110	119.63
120	124.85
130	129.77
140	134.6
150	139.56
160	144.2
170	148.79
180	153.34
190	157.68
200	162.12
210	166.44
220	170.56
230	174.62
240	178.44
250	181.7
260	184.7
270	188.1
280	191.4
290	194.2
300	197.1
310	199.5
320	202.1
330	204.7
340	207.4
350	209.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2826.42
30	2436.13
35	2163.91
40	1960.41
45	1803.36
50	1679.34
55	1580.29
60	1507.8
65	1461.46
70	1436.34
75	1424.38
80	1418.68
85	1415.7
90	1413.65
95	1412.23
100	1410.91
105	1409.92
110	1408.95
115	1408.18
120	1407.53

#End of manufacturer data file