#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900202266
Mfr serial number	STN11171-02266

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	25/04/2001
PROBLEM	NO
PASSED	YES
Run number	20220900202266

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11741
I_LEAK350V (microA)	0.17439
Substr Origin	083
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	70
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	39.01
20	53.82
30	61.77
40	68.33
50	73.99
60	78.96
70	83.74
80	88.46
90	93.04
100	97.43
110	101.7
120	105.85
130	109.82
140	113.61
150	117.41
160	121.23
170	124.85
180	128.21
190	132.03
200	135.3
210	138.83
220	141.95
230	145.13
240	147.94
250	150.98
260	153.7
270	156.27
280	158.96
290	161.33
300	163.89
310	166.24
320	168.45
330	170.55
340	172.57
350	174.39
	
#CV	
10	
15	O.L.
20	O.L.
25	2814.04
30	2425.01
35	2153.45
40	1951.55
45	1795.62
50	1672.72
55	1575.47
60	1505.73
65	1462.03
70	1438.71
75	1427.55
80	1422.11
85	1419.18
90	1417.25
95	1415.78
100	1414.5
105	1413.48
110	1412.68
115	1411.86
120	1411.05

#End of manufacturer data file