#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900202349
Mfr serial number	STN11174-02349

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	24/04/2001
PROBLEM	NO
PASSED	YES
Run number	20220900202349

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.09475
I_LEAK350V (microA)	0.13759
Substr Origin	081
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	70
R Bias Upper (MOhm)	1.58
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.93
20	46.57
30	53.08
40	58.02
50	62.26
60	65.91
70	69.4
80	72.96
90	76.38
100	79.83
110	83.14
120	86.28
130	89.24
140	92.06
150	94.75
160	97.37
170	99.87
180	102.3
190	104.72
200	107.04
210	109.35
220	111.59
230	113.8
240	115.95
250	118.06
260	120.17
270	122.17
280	124.21
290	126.21
300	128.2
310	130.15
320	132.05
330	133.94
340	135.8
350	137.59
	
#CV	
10	
15	O.L.
20	O.L.
25	2843.51
30	2451.14
35	2178.8
40	1971.76
45	1813.05
50	1687.76
55	1587.31
60	1512.99
65	1464.5
70	1437.62
75	1424.2
80	1417.69
85	1414.26
90	1412.07
95	1410.51
100	1409.24
105	1408.1
110	1407.26
115	1406.49
120	1405.65

#End of manufacturer data file