#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900202355
Mfr serial number	STN11174-02355

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	24/04/2001
PROBLEM	NO
PASSED	YES
Run number	20220900202355

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.09876
I_LEAK350V (microA)	0.14264
Substr Origin	081
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	70
R Bias Upper (MOhm)	1.58
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.82
20	49.35
30	56.11
40	61.28
50	65.61
60	69.37
70	72.95
80	76.53
90	80.08
100	83.63
110	86.97
120	90.12
130	93.13
140	95.98
150	98.76
160	101.46
170	104.05
180	106.58
190	109.09
200	111.48
210	113.85
220	116.15
230	118.43
240	120.68
250	122.84
260	124.98
270	127.03
280	129.06
290	131.09
300	133.07
310	135
320	136.9
330	138.86
340	140.77
350	142.64
	
#CV	
10	
15	O.L.
20	O.L.
25	2842.95
30	2450.42
35	2178.29
40	1971.56
45	1813.21
50	1688.1
55	1587.22
60	1511.85
65	1462.49
70	1435.57
75	1422.64
80	1416.51
85	1413.21
90	1411.07
95	1409.52
100	1408.23
105	1407.15
110	1406.27
115	1405.43
120	1404.72

#End of manufacturer data file