#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900202356
Mfr serial number	STN11174-02356

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	24/04/2001
PROBLEM	NO
PASSED	YES
Run number	20220900202356

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.09718
I_LEAK350V (microA)	0.14033
Substr Origin	081
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	70
R Bias Upper (MOhm)	1.58
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open	717																																							

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.37
20	48.53
30	55.12
40	60.25
50	64.58
60	68.22
70	71.67
80	75.11
90	78.6
100	82
110	85.36
120	88.55
130	91.54
140	94.43
150	97.18
160	99.82
170	102.29
180	104.84
190	107.28
200	109.7
210	112.02
220	114.32
230	116.54
240	118.74
250	120.86
260	122.98
270	124.99
280	127.05
290	129.02
300	131.01
310	132.94
320	134.82
330	136.66
340	138.5
350	140.33
	
#CV	
10	
15	O.L.
20	O.L.
25	2842.78
30	2450.44
35	2178.21
40	1971.27
45	1812.85
50	1687.68
55	1586.93
60	1511.9
65	1462.64
70	1435.57
75	1422.89
80	1416.94
85	1413.76
90	1411.63
95	1410.09
100	1408.83
105	1407.75
110	1406.89
115	1406.08
120	1405.23

#End of manufacturer data file