#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900202365
Mfr serial number	STN11174-02365

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	24/04/2001
PROBLEM	NO
PASSED	YES
Run number	20220900202365

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.09941
I_LEAK350V (microA)	0.14396
Substr Origin	081
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	75
R Bias Upper (MOhm)	1.58
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.92
20	49.08
30	56.57
40	61.92
50	66.32
60	70.12
70	73.65
80	77.25
90	80.77
100	84.14
110	87.45
120	90.56
130	93.65
140	96.61
150	99.41
160	102.09
170	104.68
180	107.3
190	109.81
200	112.29
210	114.66
220	116.97
230	119.26
240	121.54
250	123.71
260	125.89
270	127.97
280	130.06
290	132.15
300	134.18
310	136.19
320	138.14
330	140.14
340	142.07
350	143.96
	
#CV	
10	
15	O.L.
20	O.L.
25	2922.96
30	2518.17
35	2237.6
40	2025.11
45	1861.34
50	1732
55	1626.83
60	1545.08
65	1487.2
70	1452.14
75	1433.82
80	1424.97
85	1420.51
90	1417.94
95	1416.18
100	1414.82
105	1413.63
110	1412.63
115	1411.8
120	1410.95

#End of manufacturer data file