#General information ITEM section %ITEM SERIAL NUMBER 20220900202372 Mfr serial number STN11179-02372 #Test information Test section %TEST TEST DATE (DD/MM/YYYY) 25/04/2001 PROBLEM NO PASSED YES Run number 20220900202372 #Test data Data section %DATA TEMPERATURE (C) 27 I_LEAK150V (microA) 0.14116 I_LEAK350V (microA) 0.2137 Substr Origin 084 Substr Orient 111 Substr R Upper (kOhm.cm) 8 Substr R Lower (kOhm.cm) 4 Thickness (micron) 292 Vdep (V) 70 R Bias Upper (MOhm) 1.46 R Bias Lower (MOhm) 1.21 #Comment section %COMMENT #Defects section %DEFECT #DEFECT NAME Implant-Open Implant-Short Oxide-Punchthrough Pinhole 186 Pinhole 187 Pinhole 188 Pinhole 193 Pinhole 194 Pinhole 196 Pinhole 197 Pinhole 198 Pinhole 208 Short Open %WEBLINK #DESCRIPTION URL #IV raw data Raw data section %RAWDATA DATA #IV 10 45.32 20 63.31 30 73.24 40 81.33 50 88.47 60 94.92 70 101.18 80 107.27 90 112.73 100 117.86 110 122.91 120 128.03 130 132.39 140 137.03 150 141.16 160 144.97 170 149.52 180 153.46 190 157.45 200 161.35 210 165.33 220 168.99 230 172.53 240 176.34 250 179.96 260 183.7 270 187.1 280 190.5 290 193.9 300 197.3 310 200.5 320 204 330 207.1 340 210.5 350 213.7 #CV 10 15 O.L. 20 O.L. 25 2782.65 30 2396.65 35 2127.91 40 1924.48 45 1768.8 50 1646.03 55 1549.76 60 1482.87 65 1442.83 70 1422.9 75 1413.94 80 1409.65 85 1407.25 90 1405.57 95 1404.24 100 1403.17 105 1402.22 110 1401.58 115 1400.75 120 1400.09 #End of manufacturer data file