#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900202442
Mfr serial number	STN11181-02442

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/04/2001
PROBLEM	NO
PASSED	YES
Run number	20220900202442

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11134
I_LEAK350V (microA)	0.16234
Substr Origin	084
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	70
R Bias Upper (MOhm)	1.57
R Bias Lower (MOhm)	1.43

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.42
20	56.54
30	64.46
40	70.33
50	75.03
60	79.19
70	83.33
80	87.46
90	91.35
100	95.02
110	98.54
120	101.87
130	105.12
140	108.26
150	111.34
160	114.34
170	117.21
180	120.08
190	122.77
200	125.67
210	128.36
220	131.01
230	133.6
240	136.16
250	138.68
260	141.19
270	143.63
280	146.06
290	148.33
300	150.82
310	153.15
320	155.44
330	157.75
340	160.05
350	162.34
	
#CV	
10	
15	O.L.
20	O.L.
25	2797.51
30	2411.61
35	2142.49
40	1940.43
45	1784.28
50	1660.42
55	1562.68
60	1493.17
65	1450.41
70	1427.68
75	1417.29
80	1412.31
85	1409.5
90	1407.67
95	1406.17
100	1405.03
105	1404.07
110	1403.17
115	1402.42
120	1401.7

#End of manufacturer data file