#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900202446
Mfr serial number	STN11181-02446

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/04/2001
PROBLEM	NO
PASSED	YES
Run number	20220900202446

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12128
I_LEAK350V (microA)	0.17987
Substr Origin	084
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	70
R Bias Upper (MOhm)	1.57
R Bias Lower (MOhm)	1.43

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.86
20	58.73
30	67.4
40	73.9
50	79.2
60	84.07
70	88.99
80	93.8
90	98.32
100	102.56
110	106.59
120	110.42
130	114.17
140	117.78
150	121.28
160	124.69
170	127.98
180	131.27
190	134.34
200	137.64
210	140.73
220	143.83
230	146.82
240	149.79
250	152.73
260	155.63
270	158.42
280	161.25
290	163.84
300	166.65
310	169.34
320	172.09
330	174.8
340	177.57
350	179.87
	
#CV	
10	
15	O.L.
20	O.L.
25	2810.07
30	2422.92
35	2152.84
40	1950.32
45	1793.2
50	1668.6
55	1569.88
60	1498.86
65	1454.14
70	1429.87
75	1418.24
80	1412.67
85	1409.58
90	1407.64
95	1406.12
100	1404.91
105	1403.87
110	1402.95
115	1402.13
120	1401.49

#End of manufacturer data file