#General information ITEM section %ITEM SERIAL NUMBER 20220900202456 Mfr serial number STN11181-02456 #Test information Test section %TEST TEST DATE (DD/MM/YYYY) 26/04/2001 PROBLEM NO PASSED YES Run number 20220900202456 #Test data Data section %DATA TEMPERATURE (C) 26 I_LEAK150V (microA) 0.09936 I_LEAK350V (microA) 0.14464 Substr Origin 085 Substr Orient 111 Substr R Upper (kOhm.cm) 8 Substr R Lower (kOhm.cm) 4 Thickness (micron) 289 Vdep (V) 70 R Bias Upper (MOhm) 1.57 R Bias Lower (MOhm) 1.43 #Comment section %COMMENT #Defects section %DEFECT #DEFECT NAME Implant-Open Implant-Short Oxide-Punchthrough Pinhole Short Open %WEBLINK #DESCRIPTION URL #IV raw data Raw data section %RAWDATA DATA #IV 10 36.3 20 48.68 30 55.99 40 61.19 50 65.38 60 69.18 70 72.99 80 76.81 90 80.56 100 84.11 110 87.48 120 90.63 130 93.65 140 96.55 150 99.36 160 102.09 170 104.68 180 107.29 190 109.79 200 112.25 210 114.68 220 117.07 230 119.39 240 121.68 250 123.93 260 126.14 270 128.3 280 130.44 290 132.58 300 134.6 310 136.74 320 138.77 330 140.76 340 142.72 350 144.64 #CV 10 15 O.L. 20 O.L. 25 2844.34 30 2451.72 35 2178.02 40 1973.12 45 1814.16 50 1688.58 55 1589.33 60 1517.51 65 1472.16 70 1447.87 75 1436.21 80 1430.66 85 1427.59 90 1425.54 95 1423.97 100 1422.71 105 1422.25 110 1421.34 115 1420.5 120 1419.76 #End of manufacturer data file