#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900202464
Mfr serial number	STN11181-02464

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/04/2001
PROBLEM	NO
PASSED	YES
Run number	20220900202464

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.10723
I_LEAK350V (microA)	0.15909
Substr Origin	085
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	70
R Bias Upper (MOhm)	1.57
R Bias Lower (MOhm)	1.43

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.63
20	51.29
30	59.2
40	64.71
50	69.36
60	73.54
70	77.78
80	82.08
90	86.25
100	90.18
110	93.89
120	97.4
130	100.7
140	104.05
150	107.23
160	110.31
170	113.25
180	116.18
190	119.09
200	121.9
210	124.68
220	127.39
230	129.95
240	132.71
250	135.29
260	137.87
270	140.32
280	142.79
290	145.19
300	147.57
310	149.98
320	152.3
330	154.5
340	156.86
350	159.09
	
#CV	
10	
15	O.L.
20	O.L.
25	2874.89
30	2476.2
35	2198.45
40	1991.13
45	1829.43
50	1701.73
55	1599.73
60	1524.16
65	1474.67
70	1447.05
75	1433.47
80	1427.02
85	1423.59
90	1421.4
95	1419.79
100	1418.52
105	1417.44
110	1416.48
115	1415.63
120	1414.8

#End of manufacturer data file