#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900202472
Mfr serial number	STN11181-02472

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	26/04/2001
PROBLEM	NO
PASSED	YES
Run number	20220900202472

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11912
I_LEAK350V (microA)	0.16601
Substr Origin	085
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	75
R Bias Upper (MOhm)	1.57
R Bias Lower (MOhm)	1.43

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	405																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	45.12
20	60.65
30	70.23
40	77.2
50	82.72
60	87.28
70	91.39
80	95.36
90	99.25
100	103
110	106.6
120	109.94
130	113.13
140	116.17
150	119.12
160	121.95
170	124.58
180	127.33
190	129.93
200	132.55
210	135.03
220	137.54
230	139.93
240	142.35
250	144.7
260	147.06
270	149.23
280	151.51
290	153.72
300	155.84
310	157.93
320	159.95
330	162.02
340	164.05
350	166.01
	
#CV	
10	
15	O.L.
20	O.L.
25	2899.65
30	2503.87
35	2226.85
40	2019.53
45	1856.01
50	1726.38
55	1621.22
60	1540.3
65	1484.93
70	1453.13
75	1437.34
80	1429.96
85	1426.15
90	1423.85
95	1422.18
100	1420.84
105	1419.73
110	1418.75
115	1417.91
120	1416.99

#End of manufacturer data file