#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900202774
Mfr serial number	STN11405-02774

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	25/05/2001
PROBLEM	NO
PASSED	YES
Run number	20220900202774

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.14759
I_LEAK350V (microA)	0.2112
Substr Origin	092
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	70
R Bias Upper (MOhm)	1.5
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	51.88
20	72.13
30	83.52
40	92.15
50	98.88
60	104.84
70	110.8
80	116.33
90	121.63
100	126.46
110	131.02
120	135.42
130	139.58
140	143.61
150	147.59
160	151.38
170	155.08
180	158.68
190	162.28
200	165.76
210	169.15
220	172.56
230	175.85
240	179.05
250	182.1
260	185.3
270	188.3
280	191.4
290	194.3
300	197.2
310	200
320	202.8
330	205.6
340	208.3
350	211.2
	
#CV	
10	
15	O.L.
20	O.L.
25	2784.81
30	2404.5
35	2137.57
40	1936.08
45	1779.93
50	1656.11
55	1561.08
60	1498.01
65	1462.56
70	1445.4
75	1437.61
80	1433.74
85	1431.37
90	1429.67
95	1428.34
100	1427.22
105	1426.27
110	1425.49
115	1424.7
120	1423.99

#End of manufacturer data file