#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900202777
Mfr serial number	STN11405-02777

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	25/05/2001
PROBLEM	NO
PASSED	YES
Run number	20220900202777

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.11762
I_LEAK350V (microA)	0.17689
Substr Origin	092
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	65
R Bias Upper (MOhm)	1.5
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.3
20	53.34
30	61.32
40	67.51
50	72.82
60	78.04
70	83.22
80	88.41
90	93.36
100	97.92
110	102.06
120	106.28
130	110.16
140	113.92
150	117.62
160	121.14
170	124.6
180	127.95
190	131.28
200	134.53
210	137.69
220	140.86
230	143.89
240	146.92
250	149.94
260	152.8
270	155.63
280	158.48
290	161.22
300	163.9
310	166.5
320	169.19
330	171.78
340	174.33
350	176.89
	
#CV	
10	
15	O.L.
20	O.L.
25	2696.42
30	2326.37
35	2066.85
40	1872.88
45	1723.5
50	1607.36
55	1523.84
60	1474.21
65	1449.48
70	1438.59
75	1433.69
80	1430.86
85	1428.95
90	1427.46
95	1426.23
100	1425.18
105	1424.24
110	1423.5
115	1422.69
120	1422.12

#End of manufacturer data file