#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900202997
Mfr serial number	STN11461-02997

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900202997

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.12281
I_LEAK350V (microA)	0.1703
Substr Origin	096
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	65
R Bias Upper (MOhm)	1.47
R Bias Lower (MOhm)	1.26

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	46.4
20	63.49
30	73.18
40	80.41
50	85.81
60	90.45
70	95.08
80	99.39
90	103.33
100	106.97
110	110.43
120	113.73
130	116.82
140	119.82
150	122.81
160	125.64
170	128.4
180	131.07
190	133.82
200	136.4
210	139
220	141.5
230	143.96
240	146.37
250	148.79
260	151.03
270	153.17
280	155.38
290	157.53
300	159.71
310	161.91
320	164.03
330	166.14
340	168.28
350	170.3
	
#CV	
10	
15	O.L.
20	O.L.
25	2657.62
30	2296.01
35	2042.03
40	1850.63
45	1703.05
50	1589.49
55	1510.7
60	1466.1
65	1444.48
70	1435
75	1430.52
80	1427.89
85	1426
90	1424.57
95	1423.35
100	1422.3
105	1421.46
110	1420.66
115	1419.98
120	1419.14

#End of manufacturer data file