#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203007
Mfr serial number	STN11461-03007

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203007

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11043
I_LEAK350V (microA)	0.16376
Substr Origin	100
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	60
R Bias Upper (MOhm)	1.47
R Bias Lower (MOhm)	1.26

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.05
20	54.51
30	61.7
40	66.94
50	71.43
60	76.11
70	80.82
80	85.21
90	89.27
100	93.21
110	96.89
120	100.39
130	103.82
140	107.16
150	110.43
160	113.6
170	116.64
180	119.68
190	122.5
200	125.56
210	128.43
220	131.17
230	133.87
240	136.58
250	139.2
260	141.81
270	144.34
280	146.83
290	149.2
300	151.82
310	154.24
320	156.67
330	159.08
340	161.43
350	163.76
	
#CV	
10	
15	O.L.
20	O.L.
25	2544.28
30	2191.61
35	1945.3
40	1762.4
45	1624.86
50	1528.37
55	1473.12
60	1447.79
65	1437.27
70	1432.4
75	1429.54
80	1427.52
85	1425.86
90	1424.43
95	1423.25
100	1422.22
105	1421.3
110	1420.52
115	1419.74
120	1419.1

#End of manufacturer data file