#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203260
Mfr serial number	STN11529-03260

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203260

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11753
I_LEAK350V (microA)	0.17361
Substr Origin	103
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	65
R Bias Upper (MOhm)	1.54
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.88
20	56.43
30	64.42
40	70.47
50	75.64
60	80.78
70	85.81
80	90.55
90	94.94
100	99.13
110	103.13
120	106.98
130	110.62
140	114.12
150	117.53
160	120.93
170	123.98
180	127.41
190	130.55
200	133.62
210	136.68
220	139.61
230	142.33
240	145.2
250	147.98
260	150.74
270	153.4
280	156.08
290	158.69
300	161.25
310	163.81
320	166.3
330	168.78
340	171.22
350	173.61
	
#CV	
10	
15	O.L.
20	O.L.
25	2631.56
30	2270.12
35	2017.11
40	1827.62
45	1682.92
50	1573.96
55	1500.7
60	1459.84
65	1440.18
70	1431.39
75	1427.17
80	1424.69
85	1422.93
90	1421.56
95	1420.4
100	1419.37
105	1418.5
110	1417.81
115	1416.99
120	1416.42

#End of manufacturer data file