#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203264
Mfr serial number	STN11529-03264

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	28/11/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203264

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10374
I_LEAK350V (microA)	0.15384
Substr Origin	103
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	65
R Bias Upper (MOhm)	1.54
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.2
20	49.08
30	55.79
40	61.02
50	65.27
60	69.37
70	73.85
80	78.35
90	82.71
100	86.67
110	90.44
120	94
130	97.35
140	100.5
150	103.74
160	106.7
170	109.62
180	112.57
190	115.3
200	118.05
210	120.75
220	123.38
230	125.89
240	128.44
250	130.94
260	133.38
270	135.74
280	138.21
290	140.48
300	142.81
310	145.17
320	147.35
330	149.56
340	151.69
350	153.84
	
#CV	
10	
15	O.L.
20	O.L.
25	2663.74
30	2300.5
35	2046.32
40	1855.53
45	1710.3
50	1598.83
55	1520.27
60	1474.12
65	1451.42
70	1441.69
75	1437.04
80	1434.31
85	1432.45
90	1430.9
95	1429.67
100	1428.6
105	1427.49
110	1426.65
115	1426.08
120	1425.2

#End of manufacturer data file