#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203265
Mfr serial number	STN11529-03265

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203265

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.12756
I_LEAK350V (microA)	0.2221
Substr Origin	103
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.54
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	220																																							
Pinhole	230																																							
Pinhole	297																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA	
DATA	
#IV	
10	41.32
20	57.4
30	66.04
40	72.68
50	78.61
60	84.74
70	90.72
80	96.22
90	101.37
100	106.14
110	110.75
120	115.34
130	119.44
140	123.55
150	127.56
160	131.48
170	135.26
180	138.84
190	142.75
200	146.35
210	150.13
220	153.79
230	157.64
240	161.58
250	165.56
260	169.59
270	173.56
280	177.95
290	182.2
300	187
310	192.2
320	198.1
330	204.5
340	213
350	222.1
	
#CV	
10	
15	O.L.
20	O.L.
25	2674.91
30	2307.39
35	2049.84
40	1856.73
45	1708.33
50	1593.7
55	1511.25
60	1461.26
65	1435.55
70	1424.04
75	1418.63
80	1415.71
85	1413.79
90	1412.34
95	1411.16
100	1410.13
105	1409.22
110	1408.4
115	1407.8
120	1407.07

#End of manufacturer data file