#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203278
Mfr serial number	STN11529-03278

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203278

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.12067
I_LEAK350V (microA)	0.183
Substr Origin	103
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	65
R Bias Upper (MOhm)	1.54
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.73
20	54.27
30	62.38
40	68.67
50	73.86
60	79.2
70	84.92
80	90.35
90	95.37
100	100.07
110	104.52
120	108.8
130	112.85
140	116.79
150	120.67
160	124.39
170	128.01
180	131.66
190	135.13
200	138.53
210	141.96
220	145.03
230	148.44
240	151.59
250	154.75
260	157.8
270	160.76
280	163.68
290	166.53
300	169.38
310	172.22
320	174.96
330	177.69
340	180.39
350	183
	
#CV	
10	
15	O.L.
20	O.L.
25	2641.87
30	2277.86
35	2024.25
40	1833.68
45	1687.93
50	1576.52
55	1500.05
60	1457.18
65	1437.04
70	1428.67
75	1424.14
80	1421.38
85	1419.75
90	1418.77
95	1417.28
100	1416.35
105	1415.43
110	1414.54
115	1413.76
120	1413.11

#End of manufacturer data file