#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203279
Mfr serial number	STN11529-03279

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203279

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.12837
I_LEAK350V (microA)	0.1971
Substr Origin	103
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	65
R Bias Upper (MOhm)	1.54
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.27
20	56.79
30	65.47
40	72.28
50	77.75
60	83.72
70	89.88
80	95.59
90	100.95
100	106.01
110	110.77
120	115.44
130	119.83
140	124.11
150	128.37
160	132.46
170	136.43
180	140.41
190	144.25
200	147.95
210	151.65
220	155.24
230	158.76
240	162.26
250	165.73
260	169.06
270	172.32
280	175.64
290	178.83
300	181.9
310	185.1
320	187.8
330	191.1
340	194.1
350	197.1
	
#CV	
10	
15	O.L.
20	O.L.
25	2636.7
30	2273.69
35	2020.29
40	1830.29
45	1684.82
50	1574.71
55	1500.89
60	1460.66
65	1442.19
70	1434.33
75	1430.4
80	1428.03
85	1426.23
90	1424.78
95	1423.6
100	1422.55
105	1421.6
110	1420.95
115	1420.22
120	1419.59

#End of manufacturer data file