#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203280
Mfr serial number	STN11529-03280

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	18/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203280

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.13037
I_LEAK350V (microA)	0.2018
Substr Origin	103
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	287
Vdep (V)	65
R Bias Upper (MOhm)	1.54
R Bias Lower (MOhm)	1.35

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	58																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.54
20	57.49
30	66.34
40	73.15
50	79.03
60	85.13
70	91.22
80	97
90	102.39
100	107.48
110	112.37
120	117.11
130	121.62
140	125.99
150	130.37
160	134.56
170	138.37
180	142.71
190	146.6
200	150.47
210	154.32
220	158.04
230	161.72
240	165.35
250	168.94
260	172.43
270	175.79
280	179.21
290	182.6
300	185.9
310	189.1
320	192.2
330	195.5
340	198.6
350	201.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2653.85
30	2287.94
35	2032.14
40	1840.08
45	1692.74
50	1580.12
55	1503.1
60	1460.59
65	1440.92
70	1432.52
75	1428.52
80	1426.04
85	1424.26
90	1422.85
95	1421.65
100	1420.64
105	1419.75
110	1419.1
115	1418.32
120	1417.69

#End of manufacturer data file