#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203297
Mfr serial number	STN11528-03297

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203297

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.14272
I_LEAK350V (microA)	0.2065
Substr Origin	102
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	65
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	579																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	46.9
20	65.76
30	75.05
40	82.13
50	88.81
60	94.78
70	100.78
80	106.57
90	112.1
100	117.48
110	122.73
120	127.81
130	132.86
140	137.76
150	142.72
160	147.43
170	152.14
180	156.13
190	159.01
200	162.96
210	167.27
220	171.18
230	174.92
240	178.59
250	182.2
260	185.6
270	188.6
280	191.5
290	194
300	196.47
310	198.8
320	200.9
330	202.9
340	204.7
350	206.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2618.02
30	2255.84
35	1999.76
40	1811.19
45	1666.41
50	1557.5
55	1485.62
60	1447.42
65	1430.02
70	1422.69
75	1419.18
80	1417.03
85	1415.44
90	1414.19
95	1413.17
100	1412.37
105	1411.65
110	1411.2
115	1410.54
120	1410.13

#End of manufacturer data file