#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203320
Mfr serial number	STN11528-03320

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	21/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203320

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.11709
I_LEAK350V (microA)	0.17993
Substr Origin	101
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	60
R Bias Upper (MOhm)	1.48
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.11
20	51.47
30	59.34
40	65.21
50	70.56
60	76.24
70	81.92
80	87.17
90	92.06
100	96.71
110	101.09
120	105.29
130	109.4
140	113.24
150	117.09
160	120.86
170	124.55
180	128.16
190	131.69
200	135.17
210	138.35
220	141.88
230	145.12
240	148.28
250	151.29
260	154.48
270	157.54
280	160.56
290	163.42
300	166.32
310	169.1
320	171.76
330	174.54
340	177.26
350	179.93
	
#CV	
10	
15	O.L.
20	O.L.
25	2534.1
30	2184.69
35	1936.78
40	1754.86
45	1617.24
50	1520.33
55	1463.53
60	1436.96
65	1426.1
70	1421.32
75	1418.7
80	1416.88
85	1415.46
90	1414.39
95	1413.48
100	1412.69
105	1412
110	1411.58
115	1410.97
120	1410.49

#End of manufacturer data file