#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203327
Mfr serial number	STN11426-03327

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203327

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.14795
I_LEAK350V (microA)	0.2303
Substr Origin	102
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.59
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	318																																							
Pinhole	327																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA	
#IV	
10	45.83
20	65.45
30	75.5
40	83.42
50	90.38
60	97.05
70	104.12
80	110.6
90	116.59
100	122.28
110	127.76
120	133.09
130	138.14
140	143.09
150	147.95
160	152.38
170	156.86
180	161.2
190	165.89
200	170.26
210	174.63
220	178.85
230	183
240	187.1
250	191.2
260	195.2
270	199.3
280	203.4
290	207.4
300	211.3
310	215.4
320	219.3
330	223.2
340	226.9
350	230.3
	
#CV	
10	
15	O.L.
20	O.L.
25	2578.42
30	2223.15
35	1975.18
40	1788.22
45	1646.1
50	1541.77
55	1475.82
60	1443
65	1429.2
70	1423.38
75	1420.26
80	1418.15
85	1416.55
90	1415.27
95	1414.23
100	1413.38
105	1412.55
110	1411.81
115	1411.39
120	1410.81

#End of manufacturer data file