#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203329
Mfr serial number	STN11426-03329

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203329

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11085
I_LEAK350V (microA)	0.16508
Substr Origin	102
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	284
Vdep (V)	60
R Bias Upper (MOhm)	1.59
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.92
20	52.84
30	60.4
40	66.12
50	70.86
60	75.51
70	80.16
80	84.7
90	89.08
100	93.15
110	96.99
120	100.65
130	104.16
140	107.44
150	110.85
160	114.07
170	117.22
180	120.31
190	123.33
200	126.3
210	129.2
220	132.07
230	134.86
240	137.58
250	140.28
260	142.92
270	145.46
280	147.96
290	150.45
300	152.91
310	155.37
320	157.84
330	160.33
340	162.72
350	165.08
	
#CV	
10	
15	O.L.
20	O.L.
25	2589.75
30	2234.54
35	1986.23
40	1800.13
45	1658.5
50	1553.8
55	1487.83
60	1454.2
65	1439.24
70	1432.66
75	1429.24
80	1427.01
85	1425.36
90	1423.96
95	1422.84
100	1421.77
105	1420.82
110	1420.08
115	1419.32
120	1418.6

#End of manufacturer data file