#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203330
Mfr serial number	STN11426-03330

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203330

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11951
I_LEAK350V (microA)	0.17656
Substr Origin	102
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	289
Vdep (V)	60
R Bias Upper (MOhm)	1.59
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.29
20	58.39
30	66.54
40	72.82
50	78.02
60	82.8
70	87.5
80	92.09
90	96.58
100	100.9
110	104.94
120	108.79
130	112.48
140	116.03
150	119.51
160	122.89
170	126.22
180	129.45
190	132.6
200	135.7
210	138.74
220	141.58
230	144.65
240	147.54
250	150.32
260	153.03
270	155.8
280	158.51
290	161.21
300	163.84
310	166.46
320	169.02
330	171.6
340	174.08
350	176.56
	
#CV	
10	
15	O.L.
20	O.L.
25	2571.71
30	2216.54
35	1968.54
40	1783.6
45	1643.32
50	1541.01
55	1478.46
60	1447.68
65	1433.98
70	1427.89
75	1424.69
80	1422.52
85	1420.87
90	1419.57
95	1418.47
100	1417.42
105	1416.53
110	1415.84
115	1415.17
120	1414.4

#End of manufacturer data file