#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203332
Mfr serial number	STN11426-03332

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203332

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12222
I_LEAK350V (microA)	0.1808
Substr Origin	102
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	284
Vdep (V)	65
R Bias Upper (MOhm)	1.59
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.64
20	59.53
30	68.02
40	74.38
50	79.6
60	84.62
70	89.6
80	94.44
90	99.12
100	103.49
110	107.54
120	111.44
130	115.1
140	118.65
150	122.22
160	125.73
170	129.13
180	132.43
190	135.66
200	138.82
210	141.91
220	144.97
230	147.95
240	150.9
250	153.81
260	156.65
270	159.48
280	162.28
290	165.01
300	167.73
310	170.43
320	173.07
330	175.77
340	178.39
350	180.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2595.22
30	2238.78
35	1989.26
40	1802.68
45	1660.45
50	1554.78
55	1486.64
60	1451.35
65	1435.75
70	1429.04
75	1425.59
80	1423.27
85	1421.58
90	1420.19
95	1419.06
100	1418.07
105	1417.15
110	1416.42
115	1415.78
120	1415.12

#End of manufacturer data file