#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203333
Mfr serial number	STN11426-03333

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203333

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.13511
I_LEAK350V (microA)	0.2011
Substr Origin	102
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.59
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	46.39
20	65.4
30	75
40	82.18
50	88.24
60	93.69
70	99.17
80	104.49
90	109.47
100	114.15
110	118.62
120	122.98
130	127.09
140	131.13
150	135.11
160	138.77
170	142.69
180	146.35
190	149.93
200	153.42
210	156.97
220	160.37
230	163.81
240	167.21
250	170.61
260	173.88
270	176.84
280	180.12
290	183.3
300	186.4
310	189.5
320	192.4
330	195.4
340	198.3
350	201.1
	
#CV	
10	
15	O.L.
20	O.L.
25	2568.58
30	2216
35	1970.57
40	1784.85
45	1644.53
50	1542.42
55	1478.65
60	1446.57
65	1432.57
70	1426.46
75	1423.27
80	1421.01
85	1419.42
90	1418.11
95	1416.92
100	1415.95
105	1415.08
110	1414.36
115	1413.67
120	1413.14

#End of manufacturer data file