#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203334
Mfr serial number	STN11426-03334

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	27/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203334

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.17924
I_LEAK350V (microA)	0.2836
Substr Origin	102
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	286
Vdep (V)	60
R Bias Upper (MOhm)	1.59
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	55.69
20	80.99
30	93.63
40	104.2
50	111.46
60	118.95
70	126.76
80	134.37
90	141.48
100	148.22
110	154.68
120	161.02
130	167.2
140	173.24
150	179.24
160	185.1
170	191
180	196.9
190	202.9
200	208.9
210	215.1
220	221.4
230	227.8
240	234.5
250	240.8
260	246.7
270	251.1
280	255.4
290	260
300	264.4
310	269.5
320	273.5
330	278.1
340	281.1
350	283.6
	
#CV	
10	
15	O.L.
20	O.L.
25	2578.59
30	2224.15
35	1975.8
40	1789.82
45	1648.84
50	1545.95
55	1482.44
60	1450.84
65	1437.22
70	1431.33
75	1428.17
80	1426.04
85	1424.39
90	1423.02
95	1421.88
100	1420.88
105	1420.04
110	1419.37
115	1418.66
120	1418.06

#End of manufacturer data file