#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203337
Mfr serial number	STN11426-03337

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203337

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.14149
I_LEAK350V (microA)	0.2195
Substr Origin	102
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.59
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	45.59
20	65.43
30	75.35
40	82.78
50	89.13
60	95.06
70	101.04
80	106.72
90	112.16
100	117.42
110	122.45
120	127.43
130	132.16
140	136.81
150	141.49
160	145.92
170	150.28
180	154.78
190	159.16
200	163.45
210	167.83
220	172.26
230	176.56
240	180.46
250	184.7
260	188.8
270	192.9
280	196.7
290	200.7
300	204.2
310	207.8
320	210.9
330	214.1
340	216.8
350	219.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2619.68
30	2258
35	2005.94
40	1815.31
45	1670
50	1560.74
55	1487.4
60	1447.8
65	1430.08
70	1422.72
75	1419.13
80	1416.83
85	1415.15
90	1413.82
95	1412.72
100	1411.73
105	1410.93
110	1410.35
115	1409.74
120	1409.11

#End of manufacturer data file