#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203338
Mfr serial number	STN11426-03338

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203338

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.13791
I_LEAK350V (microA)	0.2112
Substr Origin	102
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.59
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	546																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	46.2
20	65.64
30	75.57
40	82.96
50	89.09
60	94.81
70	100.4
80	105.78
90	110.9
100	115.76
110	120.39
120	125.03
130	129.37
140	133.64
150	137.91
160	142.03
170	146.05
180	150.1
190	153.98
200	157.82
210	161.63
220	165.35
230	169.01
240	172.74
250	176.51
260	180.23
270	183.8
280	187.3
290	190.9
300	194.4
310	197.9
320	201.3
330	204.7
340	208
350	211.2
	
#CV	
10	
15	O.L.
20	O.L.
25	2617.62
30	2256.61
35	2005.77
40	1815.38
45	1670.45
50	1560.78
55	1486.02
60	1445.2
65	1426.52
70	1418.54
75	1414.69
80	1412.28
85	1410.58
90	1409.14
95	1407.96
100	1406.95
105	1406.03
110	1405.38
115	1404.65
120	1404.02

#End of manufacturer data file