#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203339
Mfr serial number	STN11426-03339

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203339

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.1368
I_LEAK350V (microA)	0.2098
Substr Origin	102
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	65
R Bias Upper (MOhm)	1.59
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	45.49
20	64.65
30	74.51
40	82
50	88.25
60	93.86
70	99.51
80	104.93
90	110.01
100	114.85
110	119.49
120	124.05
130	128.36
140	132.57
150	136.8
160	140.85
170	144.84
180	148.63
190	152.67
200	156.44
210	160.2
220	163.86
230	167.47
240	171.09
250	174.75
260	178.3
270	181.8
280	185.3
290	188.8
300	192.3
310	195.8
320	199.3
330	202.9
340	206.6
350	209.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2659
30	2291.86
35	2036.31
40	1843.02
45	1695.44
50	1582.89
55	1504.75
60	1460.35
65	1438.91
70	1429.7
75	1425.39
80	1422.92
85	1421.19
90	1419.74
95	1418.6
100	1417.51
105	1416.71
110	1416
115	1415.23
120	1414.69

#End of manufacturer data file