#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900203340
Mfr serial number	STN11426-03340

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/06/2001
PROBLEM	NO
PASSED	YES
Run number	20220900203340

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13273
I_LEAK350V (microA)	0.2008
Substr Origin	102
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.59
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	44.63
20	63.2
30	72.76
40	79.93
50	85.86
60	91.3
70	96.78
80	102.04
90	106.97
100	111.67
110	116.11
120	120.5
130	124.63
140	128.67
150	132.73
160	136.63
170	140.42
180	144.04
190	147.85
200	151.38
210	154.95
220	158.41
230	161.76
240	165.17
250	168.59
260	171.86
270	175.16
280	178.46
290	181.7
300	184.8
310	188
320	191.1
330	194.4
340	197.5
350	200.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2642.09
30	2277.13
35	2023.39
40	1831.28
45	1684.72
50	1573.22
55	1496.74
60	1454.3
65	1434.22
70	1425.62
75	1421.42
80	1419.03
85	1417.15
90	1415.79
95	1414.58
100	1413.44
105	1412.64
110	1411.88
115	1411.34
120	1410.58

#End of manufacturer data file